VA10LC18A500 [KYOCERA AVX]

AVX Multilayer Ceramic Transient Voltage Suppressors ESD Protection for CMOS, Bi Polar and SiGe Based Systems; AVX多层陶瓷瞬态电压抑制器ESD保护CMOS ，双极地和SiGe Based系统


型号：	VA10LC18A500
厂家：	KYOCERA AVX
描述：	AVX Multilayer Ceramic Transient Voltage Suppressors ESD Protection for CMOS, Bi Polar and SiGe Based Systems AVX多层陶瓷瞬态电压抑制器ESD保护CMOS ，双极地和SiGe Based系统
文件：	总3页 (文件大小：109K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

StaticGuard

AVX Multilayer Ceramic Transient Voltage Suppressors

ESD Protection for CMOS, Bi Polar and SiGe Based Systems

GENERAL INFORMATION

• Typical ESD failure voltage for CMOS and/or Bi Polar

is ≥ 200V.

• Low capacitance (<200pF) is required for high-speed

data transmission.

• 15kV ESD pulse (air discharge) per IEC 1000-4-2,

Level 4, generates < 20 millijoules of energy.

• Low leakage current (I_L) is necessary for battery

operated equipment.

StaticGuard

AVX

Part Number

Working Working Clamping

Test

Current

For V_C

Maximum

Leakage

Current

Transient

Energy

Rating

Peak

Current

Rating

Typical

Cap

Case

Size

Elements

Voltage Voltage

Voltage

(DC)

(AC)

VC04LC18V500 _ _

VC06LC18X500 _ _

VC08LC18A500 _ _

VC12LC18A500 _ _

VA10LC18A500 _ _

≤18.0

≤14.0

0.02

0.05

0.10

0402

0603

0805

1206

Axial

≤18.0

≤14.0

200

Termination/Lead Finish Code

Packaging Code

V_W(DC) DC Working Voltage (V)

V_W(AC) AC Working Voltage (V)

Not RoHS Compliant

V_C

I_VC

Clamping Voltage (V @ I_VC)

Test Current for V_C(A, 8x20μS)

I_L

E_T

Maximum Leakage Current at the Working Voltage (μA)

Transient Energy Rating (J, 10x1000μS)

LEAD-FREE COMPATIBLE

COMPONENT

I_P

Cap

Peak Current Rating (A, 8x20μS)

Typical Capacitance (pF) @ frequency specified and 0.5 V

For RoHS compliant products,

please select correct termination style.

PART NUMBER IDENTIFICATION

Chips

Axials

V C 08 LC 18 A 500 R P

TERMINATION FINISH:

P = Ni/Sn Alloy (Plated)

V A 10 LC 18 A 500 R L

LEAD FINISH:

L = Copper Clad Steel,

Solder Coated

PACKAGING (Pcs/Reel)

CLAMPING VOLTAGE

ENERGY RATING

PACKAGING (Pcs/Reel)

CLAMPING VOLTAGE

ENERGY RATING

WORKING VOLTAGE (0-18VDC)

LOW CAPACITANCE DESIGN

CASE SIZE DESIGNATOR

CASE STYLE

WORKING VOLTAGE (0-18VDC)

LOW CAPACITANCE DESIGN

CASE SIZE DESIGNATOR

CASE STYLE

PRODUCT DESIGNATOR

StaticGuard

AVX Multilayer Ceramic Transient Voltage Suppressors

ESD Protection for CMOS, Bi Polar and SiGe Based Systems

TYPICAL PERFORMANCE DATA

StaticGuard ESD RESPONSE

IEC 1000-4-2 (8 Kv Contact Discharge)

VC06LC18X500 Capacitance Histogram

30%

25%

20%

VC08LC18A500

VC12LC18A500

VC06LC18X500

15%

10%

100

1000

10000

Capacitance (pF @ 1MHz & 0.5V)

Number of ESD Strikes

Measured Data

Calculated

VC08LC18A500 Capacitance Histogram

StaticGuard S21

14%

12%

VC12LC18A500

VC08LC18A500

12%

-10

-20

-30

-40

10%

VC06LC18X500

61 63

65 67 69 71 73 75 77 79 81 83 85 87 89

Capacitance (pF)

500

1000

1500

2000

2500

Frequency (MHz)

1MHz, 0.5VRMS

Measured Data

Calculated Distribution

VC12LC18A500 Capacitance Histogram

VI Curves - StaticGuard Products

100

14%

12%

10%

10^-9

10^-6

10^-3

10⁺⁰

10⁺³

161 163 165 167 169 171 173 175 177 179 181 183 185 187 189

Capacitance (pF)

Current (A)

1MHz, 0.5VRMS

Measured Data

Calculated Distribution

06LC

08LC

12LC

10LC

StaticGuard

AVX Multilayer Ceramic Transient Voltage Suppressors

TYPICAL PERFORMANCE CURVES (0402 CHIP SIZE)

VOLTAGE/CURRENT CHARACTERISTICS PULSE DEGRADATION

Multilayer construction and improved grain structure result in

excellent transient clamping characteristics up to 20 amps

peak current, while maintaining very low leakage currents

under DC operating conditions. The VI curves below show the

voltage/current characteristics for the 5.6V, 9V, 14V, 18V and

low capacitance StaticGuard parts with currents ranging from

parts of a micro amp to tens of amps.

Traditionally varistors have suffered degradation of electrical

performance with repeated high current pulses resulting in

decreased breakdown voltage and increased leakage cur-

rent. It has been suggested that irregular intergranular

boundaries and bulk material result in restricted current

paths and other non-Schottky barrier paralleled conduction

paths in the ceramic. Repeated pulsing of TransGuard^®tran-

sient voltage suppressors with 150Amp peak 8 x 20μS

waveforms shows negligible degradation in breakdown

voltage and minimal increases in leakage current. This

does not mean that TransGuard^®suppressors do not suffer

degradation, but it occurs at much higher current.

100

VC04LC18V500

VC040218X400

VC040214X300

VC040209X200

VC040205X150

ESD TEST OF 0402 PARTS

VC04LC18V500

VC040218X400

10^-9

10^-7

10^-5

10^-3

10^-1

10³

10⁵

Current (A)

VC040214X300

VC040209X200

PEAK POWER VS PULSE DURATION

1300

VC040205X150

1200

1100

100

1000

10000

8kV ESD STRIKES

VC040218X400

VC040214X300

1000

VC040209X200

INSERTION LOSS CHARACTERISTICS

900

VC04LC18V500

VC040205X150

800

700

600

500

400

300

200

100

-5

-10

VC04LC18V

VC040218X

-15

VC040214X

VC040209X

VC040205X

-20

-25

0.01

0.1

100

IMPULSE DURATION (μS)

1000

Frequency (GHz)

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